发明名称 A METHOD AND A DEVICE FOR CHECKING THE CONDITION OF SEMICONDUCTOR VALVES
摘要 <p>An electric semiconductor valve (V), for example a valve in a converter for conversion between alternating current and high-voltage direct current, comprises a plurality of semiconductor positions (TS1, TS2, ... TSN) with mutually series-connected semiconductor devices (T1, T2, ... TN). With the semiconductor valve energized by an alternating voltage substantially corresponding to the rated voltage thereof, the condition of an optional semiconductor position is checked by generating a test firing signal (FP) and supplying it to the firing channel (L, 1, TCU, 3) of the semiconductor position alone, whereupon an indicating signal (IP) delivered by the indicating channel (TCU, 2, D) of the semiconductor position is studied with respect to time.</p>
申请公布号 WO1994006028(A1) 申请公布日期 1994.03.17
申请号 SE1993000662 申请日期 1993.08.11
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