发明名称 COINCIDENT ACTIVATION OF PASS TRANSISTORS IN A RANDOM ACCESS MEMORY
摘要 2141860 9406120 PCTABS00030 The pass transistors in a random access memory array are activated only upon coincident (simultaneous) selection of both the associated row and the associated column of the memory cell; otherwise, activation of the pass transistors is prevented. Thus, when a word line is selected, only the pass transistors in the memory cell corresponding to a simultaneously selected bit line is active, rather than all of the pass transistors pairs connected to the word line. Transient power consumption during word line selection and deselection is thereby reduced. Coincident pass transistor activation may be obtained by providing a column select line for each column of the memory array, and gating means in each cell which electrically activates the associated pass transistors only upon simultaneous selection of the associated column select line and the associated work line, and for preventing activation of the associated pass transistors otherwise. When the column select lines and gating means are used, shared bit lines may be provided in the array. A single shared bit line may be used between adjacent columns of cells since only one of the columns will be selected by the column select line. A high density memory design is therefore provided.
申请公布号 CA2141860(A1) 申请公布日期 1994.03.17
申请号 CA19932141860 申请日期 1993.08.30
申请人 THUNDERBIRD TECH INC 发明人 VINAL ALBERT W
分类号 G11C11/418;G11C11/412;(IPC1-7):G11C11/412 主分类号 G11C11/418
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