发明名称 |
DEPLETION SIMULATION DEVICE |
摘要 |
PURPOSE:To automatically analyze the depleted state of a mono-pole impurities area based on a given impurities distribution of a semiconductor element. CONSTITUTION:A depletion simulation device 1 means an entire depletion simulation device. A depletion area recognizing device 2 recognizes the mono-pole impurities area that depletes itself. A virtual electrode setting device 3 determines a virtual electrode setting position and applies them to a given semiconductor element structure. A virtual element deletion device 4 restores it to the semiconductor element structure whose virtual electrode has been last. A depletion deciding device 5 decides whether depletion should be done considering the obtained electron/hole density distribution. A device simulation device 6 means a device simulation device using conventional technology. |
申请公布号 |
JPH0669493(A) |
申请公布日期 |
1994.03.11 |
申请号 |
JP19920221072 |
申请日期 |
1992.08.20 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
UMEDA TAKUYA |
分类号 |
H01L29/00;G06F17/50;G06F19/00 |
主分类号 |
H01L29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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