发明名称 DEPLETION SIMULATION DEVICE
摘要 PURPOSE:To automatically analyze the depleted state of a mono-pole impurities area based on a given impurities distribution of a semiconductor element. CONSTITUTION:A depletion simulation device 1 means an entire depletion simulation device. A depletion area recognizing device 2 recognizes the mono-pole impurities area that depletes itself. A virtual electrode setting device 3 determines a virtual electrode setting position and applies them to a given semiconductor element structure. A virtual element deletion device 4 restores it to the semiconductor element structure whose virtual electrode has been last. A depletion deciding device 5 decides whether depletion should be done considering the obtained electron/hole density distribution. A device simulation device 6 means a device simulation device using conventional technology.
申请公布号 JPH0669493(A) 申请公布日期 1994.03.11
申请号 JP19920221072 申请日期 1992.08.20
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 UMEDA TAKUYA
分类号 H01L29/00;G06F17/50;G06F19/00 主分类号 H01L29/00
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