发明名称 FAULT DETECTION CIRCUIT INSPECTION SYSTEM
摘要 PURPOSE:To provide a fault detection circuit inspection system where a processing procedure for judging the propriety of a fault detection circuit in an information processor is saved. CONSTITUTION:A fault diagnostic control part 2 which is incorporated in the information processor 1 and diagnoses a fault, a diagnosed part 3 executing the processing function of a fault diagnostic object, a fault detection circuit 4 provided in the diagnostic control part 2, the fault detection circuit inspection F/F 5 of the diagnostic part 3, which forms a scan path and controls compulsory fault detection circuits 6 and 8, the fault detection circuit 6 inspecting the fault of the processing function in the diagnostic part 3, a compulsory detection circuit 7 for inspecting the fault detection circuit 4 of the diagnostic control part 2, the compulsory fault detection circuit 8 for inspecting the fault detection circuit 6 of the diagnosed part 3 and a diagnostic processor 9 sending fault diagnostic information to the information processor 1 and judging a diagnostic result are provided.
申请公布号 JPH0667922(A) 申请公布日期 1994.03.11
申请号 JP19920218850 申请日期 1992.08.18
申请人 KOFU NIPPON DENKI KK 发明人 YANAGISAWA YASUSHI
分类号 G06F11/22 主分类号 G06F11/22
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