TESTING METHOD FOR ELECTRONIC EQUIPMENT PROVIDED WITH PLURAL FUNCTION BLOCKS,申请号JP19920221810-传众专利搜索

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发明名称	TESTING METHOD FOR ELECTRONIC EQUIPMENT PROVIDED WITH PLURAL FUNCTION BLOCKS
摘要
申请公布号	JPH0670007(A)	申请公布日期	1994.03.11
申请号	JP19920221810	申请日期	1992.08.20
申请人	FUJITSU LTD	发明人	SUGIYAMA KOJI
分类号	H04M3/22;(IPC1-7):H04M3/22	主分类号	H04M3/22
代理机构		代理人
主权项
地址

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