发明名称 DEVICE TESTER
摘要 PURPOSE:To reduce the number of device testers and to considerably reduce production cost including the design and manufacture cost of the testers. CONSTITUTION:When a test start instruction is given from IO15, MCP12 test- starts a tested product 2 by ST through EQIF 11. In the tested product 2, CPU 22 returns a recognition signal to CTL through TIF 21 when preparation completes. CPU 22 conducts the test of FA24a-FN24n by test data transmitted by DT and returns test result data to DT. The tester 1 transmits a voice signal by VU and CKD, and returns the voice signal by VU and CKU when the tested product 2 is normal. When all the tests of the tested products 2 by a test program terminate, MCP 12 transmits a test termination signal to ST and receives the recognition signal by CTL. A test process during the test is minutely displayed in IO15.
申请公布号 JPH0667924(A) 申请公布日期 1994.03.11
申请号 JP19920223725 申请日期 1992.08.24
申请人 NEC CORP 发明人 NAKAZATO YOSHINOBU
分类号 G06F11/22 主分类号 G06F11/22
代理机构 代理人
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