发明名称 Verfahren und Vorrichtung zum Spalten von Halbleiterplatten und Bekleiden der gespalteten Facetten.
摘要 <p>A method for cleaving semiconductor wafers, or segments thereof, which comprises placing the wafer (11), provided with scribe lines (15) defining the planes where cleaving is to take place, inbetween a pair of flexible transport bands (12,13) and guiding it around a curved, large radius surface (21) thereby applying a bending moment. With a moment of sufficient magnitude, individual bars (22) are broken off the wafer as this is advanced, the bars having front- and rear-end facets. On cleaving, each bar, while still pressed against the curved surface, is automatically separated whereby mutual damage of the facets of neighbouring bars is prevented. For further handling, e.g. for the transport of the bars to an evaporation station for passivation layer deposition, provisions are made to keep the bars separated. Cleaving and the subsequent passivation coating can be carried out in-situ in a vacuum system to prevent facet contamination prior to applying the passivation.</p>
申请公布号 DE69006353(D1) 申请公布日期 1994.03.10
申请号 DE1990606353 申请日期 1990.05.25
申请人 INTERNATIONAL BUSINESS MACHINES CORP., ARMONK, N.Y., US 发明人 BROOM, RONALD F., DR., CH-8002 ZUERICH, CH;GASSER, MARCEL, CH-8041 ZUERICH, CH;HARDER, CHRISTOPH, DR., CH-8038 ZUERICH, CH;LATTA, ERNST-EBERHARD, DR., CH-8134 ADLISWIL, CH;OOSENBRUG, ALBERTUS, CH-8135 LANGNAU AM ALBIS, CH;RICHARD, HEINZ, CH-8802 KILCHBERG, CH;VETTIGER, PETER, CH-8135 LANGNAU AM ALBIS, CH
分类号 B28D5/00;H01L21/301;H01S5/00;H01S5/02;(IPC1-7):B28D5/00;H01L21/00 主分类号 B28D5/00
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