发明名称 Apparatus for detecting abnormal condition of cuttable objective material for use in a cutting machine
摘要 An apparatus for detecting abnormal conditions of a fabric on a table and a cutter which is movable along a length of the table for cutting at any desired angle relative to a center line. The abnormal condition is detected before the material is cut thereby avoiding cutting a material with an abnormality.
申请公布号 US5289749(A) 申请公布日期 1994.03.01
申请号 US19920935180 申请日期 1992.08.26
申请人 SHIMA SEIKI MFG., LTD. 发明人 IMAI, TAICHI;OCHI, TOSHIRO
分类号 B26D7/00;B26D7/22;B26D7/24;B26F1/38;D06H3/10;D06H7/00;G01B5/28;G01N21/84;(IPC1-7):B26D5/00 主分类号 B26D7/00
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