发明名称 Electrochemical interconnection
摘要 Processes for fabricating electrochemical interconnections between semiconductor chip pads and substrate pads. First, pads on a substrate are electrically shorted by depositing a film of conductive metal, conductive bumps are created on the substrate pads, and the pads on the substrate are aligned with pads on a semiconductor chip. Then, by electrochemically depositing metal to the bumps, electrical interconnections are formed between the semiconductor chips pads and the substrate pads. Finally, the film of conductive metal is removed to eliminate the electrical shorting. The resulting electrochemical interconnections are highly reliable and have high tensile strengths.
申请公布号 US5290423(A) 申请公布日期 1994.03.01
申请号 US19920873848 申请日期 1992.04.27
申请人 HUGHES AIRCRAFT COMPANY 发明人 HELBER, JR., CARLYLE L.;LUDWIG, FRANK A.
分类号 H01L21/60;H01L23/498;H05K3/24;H05K3/32;(IPC1-7):C25D5/02 主分类号 H01L21/60
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