发明名称 Memory having distributed reference and bias voltages
摘要 A memory (20) has NBIAS generators (63 and 73) coupled to the positive and negative power supply lines (61 and 62) at a point close to amplifiers (84 and 85) and address buffers (76) to insure that they all receive the same power supply voltage to prevent an impact on the access times of memory (20). A VCS generator (65) is located close to power supply bonding pads (23 and 25) and to output buffers (77 and 78) to reduce the effects of power supply line noise on the noise margins. A VAREF generator provides a reference voltage to the differential amplifiers of address buffers (75 and 76). Locating VAREF generator (67) close to power supply bonding pads (23 and 25) insures that the reference voltage is always at the midpoint of the input logic swing.
申请公布号 US5291455(A) 申请公布日期 1994.03.01
申请号 US19920880381 申请日期 1992.05.08
申请人 MOTOROLA, INC. 发明人 FENG, TAISHENG;PORTER, JOHN D.;CHIAO, JENNIFER Y.
分类号 G11C11/417;G11C5/14;G11C11/401;G11C11/407;H01L27/10;H03K19/00;(IPC1-7):G11C5/14 主分类号 G11C11/417
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