发明名称 |
NORMAL/DEFECTIVE CONDITION DISCRIMINATING METHOD FOR SIZE BY EACH PROCESS FOR PRODUCTION OF RETICULE AND RETICULE HAVING MEANS FOR THIS METHOD |
摘要 |
PURPOSE:To enable the easy and instantaneous discrimination of the process which is the cause for a size defect in the normal/defective condition discriminating method for sizes by each process for production of reticules for LSIs. CONSTITUTION:This method is provided with a means 1delta for setting patterns for size measurement with the plural patterns for normal/defective condition discrimination of sizes, a means for forming the patterns for the normal/defective condition discrimination of sizes on exposure data by subjecting these patterns for normal/defective condition discrimination of sizes to only the one shift processing among plural shift processings included in the overall shift processing, a means for forming the respective corresponding patterns for normal/defective condition discrimination of sizes by printing the patterns for normal/defective condition discrimination of sizes on the exposure data on the reticule surface by exposing and a means 7delta for measuring the sizes of the respective patterns for normal/defective condition discrimination of sizes on the reticule. Which shift processing among the plural shift processings is defective is discriminated by whether the sizes of the respective patterns for normal/defective condition discrimination of sizes on the reticule are prescribed values or not. |
申请公布号 |
JPH0651497(A) |
申请公布日期 |
1994.02.25 |
申请号 |
JP19920201450 |
申请日期 |
1992.07.28 |
申请人 |
FUJITSU LTD |
发明人 |
NISHIAOKI TAKASHI;SAKURAI MITSUO |
分类号 |
G03F1/44;G03F1/84;H01L21/027 |
主分类号 |
G03F1/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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