发明名称 ABNORMALITY DIAGNOSTIC DEVICE
摘要 <p>PURPOSE:To narrow a discrimination condition to be compared in the knowledge of an abnormality detection at the time of detecting the abnormality of a plant by inferring the abnormality of a system corresponding to the state of the system inferred from input data and the knowledge of a state discrimination. CONSTITUTION:When plant data are inputted from a data inputting part 1, a state discriminating part 9 compares the data with the knowledge 10 of the state discrimination, infers the plant state of an objective plant, and transmits the discriminated result to an abnormality discriminating part 11. The discriminating part 11 selects the knowledge of the abnormality judgement corresponding to the discriminated plant state from among the knowledge 12 of the abnormality discrimination, and compares it with the plant data from the inputting part 1. The discriminating part 11 selects the knowledge 12a of the abnormality discrimination when an application condition A is established from the discrimination of the discriminating part 9, and selects the knowledge 12b when an application condition B is established. Then, the discriminating part 11 compares the discrimination condition with the input plant data, and infers the abnormality of the objective plant. When the generation of the abnormality is inferred, an abnormal equipment specifying part 4 and an abnormality cause searching part 6 derives a corresponding control guide corresponding to the cause of the abnormality by comparing the knowledge 5 of the characteristic of each sub-system with the input data.</p>
申请公布号 JPH0654372(A) 申请公布日期 1994.02.25
申请号 JP19920219630 申请日期 1992.07.28
申请人 MITSUBISHI ELECTRIC CORP 发明人 KOYAMA KENJI;TAKEMURA HIDEKI
分类号 G01D21/00;G05B23/02;H04Q9/00;(IPC1-7):H04Q9/00 主分类号 G01D21/00
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