| 摘要 |
A circuit is disclosed for use in testing and programming electronic devices. The circuit provides an electronic wave of connecting bypass capacitors to selective device pins. The circuit includes first and second diodes that are coupled intermediate first and second bypass capacitors and a device node and to the second capacitor to charge the first and second capacitors. A current source is coupled to the first and second bypass nodes to forward bias a first and second diodes, thereby coupling the device node to the first and second capacitors. To selectively decouple the first and second bypass capacitors, voltage sources are coupled to the bypass node, thereby reverse biasing the first and second diodes and effectively disconnecting the first and second bypass capacitors from the device node.
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