发明名称 ELECTROSTATIC ATTRACTION EQUIPMENT
摘要 <p>PURPOSE:To increase a reliability of a fine processing and a size measurement by detecting a state of fixation accurately when fixing a test piece on a sample holder using an electrostatic attraction equipment. CONSTITUTION:This equipment is constituted of a resistor 6 which converts detected current to voltage an amplifier 7 which amplifies the detected voltage, a comparator 8 which compares the detected voltage with a threshold voltage, a pulse width detector 10 which detects a state of attraction, and other devices. Due to this structure, when fixing a test piece on a sample holder using an electrostatic attraction equipment, a state of attraction can be detected accurately even if current flowing steadily in the test piece is too small to detect.</p>
申请公布号 JPH0645214(A) 申请公布日期 1994.02.18
申请号 JP19920046642 申请日期 1992.03.04
申请人 HITACHI LTD;HITACHI SCI SYST:KK 发明人 SATO SEISHIRO;KARUBE TOSHIMOTO
分类号 B23Q3/15;H01L21/027;H01L21/30;H01L21/68;H01L21/683;H02N13/00;(IPC1-7):H01L21/027 主分类号 B23Q3/15
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