发明名称 SEMICONDUCTOR MEMORY
摘要 PURPOSE:To provide a semiconductor device having a redundant circuit and a self-diagnositic circuit, in which a defective part to be replaced with the redundant circuit is easily determined. CONSTITUTION:A redundant circuit 2 and a self-diagnostic circuit 3 are provided in a semiconductor device. The self-diagnositic circuit includes a memory 4 and an output circuit 5. When the self-diagnostic circuit detects a defective part, the location of the defective part is stored in the storage means, and the output means produces information on the location of the defective part.
申请公布号 JPH0645451(A) 申请公布日期 1994.02.18
申请号 JP19920199583 申请日期 1992.07.27
申请人 FUJITSU LTD 发明人 KITAGAWA MASAYA
分类号 G11C11/413;G11C29/00;G11C29/02;G11C29/04;G11C29/12;G11C29/44;G11C29/48;H01L21/66;H01L21/82;(IPC1-7):H01L21/82 主分类号 G11C11/413
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