发明名称 Semiconductor integrated circuit equipped with diagnostic circuit for checking reference voltage signal supplied to internal step-down circuit
摘要 An internal step-down circuit is incorporated in an integrated circuit device for reduction in power consumption as well as for scaling-down, and produces an internal step-down power voltage level regulated to a reference voltage level internally produced by an internal reference signal generator, wherein a diagnostic circuit compares the reference voltage level with an external variable voltage level to see if or not the reference voltage level is higher than the external voltage level, and the external variable voltage level is changed to determine the matching point therebetween, thereby confirming the reference voltage level after packaging.
申请公布号 US5287012(A) 申请公布日期 1994.02.15
申请号 US19920901689 申请日期 1992.06.22
申请人 NEC CORPORATION 发明人 KOSHIKAWA, YASUJI
分类号 G01R31/28;G01R31/3185;G01R31/319;G06F11/22;G11C5/14;G11C11/401;G11C11/407;G11C11/419;G11C29/00;G11C29/12;G11C29/56;H01L27/02;(IPC1-7):H03K5/24;H03K3/01 主分类号 G01R31/28
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