Memory with I/O mappable redundant columns

摘要

A byte-wide memory has a plurality of redundant columns. Each redundant column is capable of being mapped to any one of a plurality of input buffers and output buffers in place of a defective column. Fuse match logic circuits store the addresses of defective columns. I/O fuse decoder circuits are coupled to the fuse match logic circuits and store information identifying the input and output buffers associated with each defective column. The redundant columns are selected in response to a portion of the column address signals which select nonredundant columns. When a received column address matches a stored column address, the redundant column selected by the portion of column address signals is mapped to the input and output buffer associated with the defective column in place of the defective column.