| 摘要 |
A portable programmable electronic tester capable of automatically testing a large number of different types of electronic units is disclosed. The operation of the tester is governed by a self-contained microcomputer. A programmable stimulus subsystem provides desired stimuli to a unit under test and a programmable response measuring subsystem measures specified output parameters of the unit under test. A programmable switching subsystem selectively connects the unit under test to the stimulus and response measuring subsystems via an interface device adapted to connect the unit under test to the tester. A test program designed to test the operating characteristics of a particular unit under test is stored in a bubble memory cassette. |
