| 摘要 |
PURPOSE: To test a large-sized LCD panel array with a short-circuit bar attached. CONSTITUTION: Whether a short-circuit defect is present or not is decided to test an LCD panel, and whether the defect is not present or not (or when the defect is repaired), whether an open circuit defect is present or not or whether a pixel has a defect or not are decided. While current flows to short-circuit bars 28, 30, 32, 34 for short-circuiting together a plurality of drive liens 14 or a plurality of gate lines 16, the lines 14 and 16 are scanned by a magnetic pickup unit 42 to test the defect of the LCD panel 10. If the defect exists, current flows through the short-circuited region. As a result, the corresponding magnetic field along the included line is generated. The place of the defect is identified as the intersection of the drive line and the gate line for generating te magnetic field of substantially the same strength is identified for the intersection short-circuit defect. A test signal is applied to the panel, and the resultant display pattern is checked to test the open circuit and the defect pixel of the panel.
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