发明名称 METHOD AND APPARATUS FOR ALIGNING
摘要 PURPOSE:To obtain an exposure apparatus having high accuracy and high throughput when used for the apparatus by accurately deciding a position of an alignment mark even if an alignment mark forming surface is rough, and accurately aligning an element formed with the mark. CONSTITUTION:A high resolution image signal of an alignment mark 7 is obtained by a CCD camera 8, low resolution image of the mark 7 is obtained by a CCD camera 9, a combined and multiplied signal obtained by combining and multiplying the high resolution signal and the low resolution signal of the mark 7 is obtained by imaging means 19, and a position of the mark 7 is decided from the multiplied signal.
申请公布号 JPH0629184(A) 申请公布日期 1994.02.04
申请号 JP19920183634 申请日期 1992.07.10
申请人 FUJITSU LTD 发明人 YAMABE MASAKI;FUKITA MAKIO
分类号 G03F9/00;H01L21/027;H01L21/30;(IPC1-7):H01L21/027 主分类号 G03F9/00
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