Method of and device for measuring image lag in X-ray systems.,申请号EP19890201028-传众专利搜索

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法人/股东/高管

发明名称	Method of and device for measuring image lag in X-ray systems.
摘要
申请公布号	EP0339726(B1)	申请公布日期	1994.02.02
申请号	EP19890201028	申请日期	1989.04.21
申请人	N.V. PHILIPS' GLOEILAMPENFABRIEKEN	发明人	KROON, JOHANNES NORBERTUS;SCHMAL, FRANCISCUS
分类号	A61B6/00;G21K1/04;G21K1/10;H04N5/32;H05G1/26;H05G1/64;(IPC1-7):H04N5/32	主分类号	A61B6/00
代理机构		代理人
主权项
地址

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