| 摘要 |
<p>PURPOSE:To make it possible to obtain electric continuity with a measuring apparatus readily and positively even for an IC package, whose body size is reduced by miniaturization, and to perform the inspection of electric characteristics. CONSTITUTION:An IC package 2 is fixed with a vacuum chuck 5. The deviation between a lead 3 of the IC package 2 and a contact pin 4 is adjusted with an upper camera 1 by image processing, and the correct position is set. The electric continuity with a measuring apparatus is obtained by providing the contact between the lead 3 of the IC package 2 and the contact pin 4.</p> |
