发明名称 TAPE CARRIER AND TESTING METHOD THEREOF
摘要 A tape carrier comprises contact test patterns (31, 32) used for performing a conduction test on a tape base (2). More specifically, in addition to test pads (3) connected to outer leads used for input/output signals, the contact test patterns (31, 32) are formed on the tape base to test whether socket contactors (11) are in contact with the test pads (3). A conduction test is performed using the contact test patterns. The tape is repeatedly reset to the socket until a conductive state is established, thereby preventing a test error. <IMAGE>
申请公布号 KR940000749(B1) 申请公布日期 1994.01.28
申请号 KR19900008379 申请日期 1990.06.08
申请人 TOSHIBA CO., LTD. 发明人 YOSHIDA, AKITO
分类号 G01R31/00;H01L21/60;H01L21/66;H01L23/498;H01L23/58;(IPC1-7):H01L21/66 主分类号 G01R31/00
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