发明名称 Groove structure for isolating elements comprising a GTO structure
摘要 A semiconductor structure comprises a gate-turn-off thyristor region (GR) and a diode region (DR) with an isolation area (SR) therebetween. The isolation area is provided with a multistage groove (30) having step structures (34,35). The multistage groove is formed through a two-stage etching process, and over-etched regions in the bottom corners of the multistage groove are relatively shallow ones. This structure is effective for increasing the breakdown voltage of the semiconductor structure and isolations between a the gate-turnoff thyristor region and the diode region.
申请公布号 US5281847(A) 申请公布日期 1994.01.25
申请号 US19930008833 申请日期 1993.01.25
申请人 MITSUBISHI DENKI KABUSHIK KAISHA 发明人 TOKUNOH, FUTOSHI
分类号 H01L21/332;H01L21/764;H01L29/06;H01L29/74;(IPC1-7):H01L29/06;H01L31/111 主分类号 H01L21/332
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