发明名称 INFRARED MICROMEASURING DEVICE
摘要 PURPOSE:To make the length measuring of a measuring area achievable with graduations at its time when an eyepiece is not used, especially in use of a camera by applying a diving means to a focal position of a reflecting objective mirror of an infrared microscope, particularly graduations on an aperture itself. CONSTITUTION:When the infrared reflection (or transmission) measurement of a sample is performed, this sample is illuminated from the upside (or the downside), observing it with an eyepiece, and an aperture open hole is positioned to an optional position on the sample. At this time, a two-sheet set of movable plates 19, 20 separately shiftable each in both X and Y directions by two knobs 17, 18 are formed into a variable aperture 10, a sample image, namely, length of a measuring area is measured with graduations 19', 20' set in these movable plates 19 and 20. This method is appliable to an eye obversation by means of either of an eyepiece or CCD camera. In this connection, since the graduations 19, 20' are merely good enough to be set up in a focal position of the sample image, graduations can be set aside from the aperture.
申请公布号 JPH0618410(A) 申请公布日期 1994.01.25
申请号 JP19920172392 申请日期 1992.06.30
申请人 SHIMADZU CORP 发明人 TANAKA TOYOHIKO
分类号 G01N21/27;G01N21/35;G02B21/00;(IPC1-7):G01N21/35 主分类号 G01N21/27
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