发明名称 TEST PATTERN EXPANSION SYSTEM
摘要 PURPOSE:To reduce the number of patterns by eliminating redundant patterns at the time of expanding the pattern of a clock application timing form to that of a clock waveform input form with respect to simulation patterns of a logic circuit. CONSTITUTION:Pin clock information 3 is obtained from a logic circuit 1 by a pin information extracting means 2, A clock application timing form pattern 4 is read in by a pattern read means 5, and it is checked by a pattern confirming means 6 that the clock is turned off so that the clock pattern and the other input pattern do not contend with each other. After this check, the pattern 4 is expanded to a clock waveform input form pattern 8 by a single- phase clock pattern expanding means 7 and is used as the input pattern for simulation of the logic circuit 1 by a simulation means 9 to obtain an output expected value 10.
申请公布号 JPH0612464(A) 申请公布日期 1994.01.21
申请号 JP19920169798 申请日期 1992.06.29
申请人 NEC CORP 发明人 SUZUKI YOSHIO
分类号 G06F11/22;G06F17/50 主分类号 G06F11/22
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