发明名称 IMAGE DISPLAY MEMORY INSPECTING DEVICE
摘要 PURPOSE:To enable overall inspection including a memory operation and parallel buses and to shorten inspection time by performing memory checks by using the same passage as real image display and data read out by an access method. CONSTITUTION:Parallel data (b) and (c) inputted to a D flip-flop 10 are fixed by the same clock signal as the fetch and use of data at a D/A conversion part, and inputted to a comparator 11 as a P input (d) and a Q input (e). The comparator 11 compares the P input (d) with the Q input (e) and when both of inputs are different, a P=Q output (f) is turned to a low level. Then, an LED is turned on by an OR circuit 12. Thus, since the data obtained by the same passage and access method as real image display are compared, the operation of the memory and the inspection including parallel buses can be checked at the same speed as real image display.
申请公布号 JPH0612279(A) 申请公布日期 1994.01.21
申请号 JP19920170470 申请日期 1992.06.29
申请人 MITSUBISHI ELECTRIC CORP 发明人 WADA MINORU
分类号 G06F11/22;G06F12/16 主分类号 G06F11/22
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