发明名称 |
SEMICONDUCTOR DEVICE AND FABRICATING METHOD THEREOF |
摘要 |
forming a field oxide for separating active layers; forming the first gate oxide on the active region of the substrate; depositing a photoresist layer for making the first MOS transistor; removing selectively the first gate oxide of the region for the second MOS tr.; removing the remaining PR and controlling the thickness of the first gate oxide by partial etching; finally forming the second gate oxide on the formed active areas and completing the usual fabrication process.
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申请公布号 |
KR940000511(B1) |
申请公布日期 |
1994.01.21 |
申请号 |
KR19910004633 |
申请日期 |
1991.03.23 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KANG, MYON - KU;BONG, CHIL - KUN;SHIN, DONG - HO |
分类号 |
H01L27/10;(IPC1-7):H01L27/10 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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