发明名称 FIELD EFFECT TRANSISTOR AND MANUFACTURE THEREOF
摘要 PURPOSE: To prevent a leakage current from occurring by separating a semiconductor substrate from a channel layer by a space that is formed under a channel layer. CONSTITUTION: A space 23, whose sectional shape is a triangle, is formed inside an n<+> -type GaAs layer 22, and a source/drain region is formed by two separated n<+> -type GaAs layers 22. Also a channel layer 26 of an n-type GaAs is formed over the entire inclined surface of the n<+> -type GaAs layer 22 with a space structure inside. The space 23 eliminates the generation margin of a voltage difference between the electrode of an adjacent element and a semiconductor substrate 20. That is, the formation of an unwanted depletion region between the channel region 26 and the substrate 20 is prevented, thus preventing the effects of a back gate.
申请公布号 JPH0613411(A) 申请公布日期 1994.01.21
申请号 JP19930059078 申请日期 1993.03.18
申请人 SAMSUNG ELECTRON CO LTD 发明人 RI YOUGI
分类号 H01L21/20;H01L21/285;H01L21/338;H01L29/06;H01L29/10;H01L29/812;(IPC1-7):H01L21/338 主分类号 H01L21/20
代理机构 代理人
主权项
地址