发明名称 |
X-ray examination apparatus. |
摘要 |
<p>An X-ray examination apparatus comprises an X-ray source (10) and an image intensifier (30) with an imaging screen (32). The imaging screen (32) is imaged on the pick-up face (51) of an image pick-up device (50), for example a television camera. In order to adjust or maintain the optimum response time of the image pick-up device (50) to or at the desired level, the pick-up face (51) is illuminated by means of a number of illumination elements (145). In order to achieve a compact construction of the apparatus, the illumination elements (145) are accommodated in recesses (144) in a transparent element (141). The light of the illumination elements (145) is then reflected from the entrance face (142) facing the image intensifier (30) and/or from the sides (147) of the element (141). The transparent element (141) may be a prism so that the optical path between the image intensifier (30) and the image pick-up device (50) is folded. <IMAGE></p> |
申请公布号 |
EP0579325(A1) |
申请公布日期 |
1994.01.19 |
申请号 |
EP19930202021 |
申请日期 |
1993.07.09 |
申请人 |
PHILIPS ELECTRONICS N.V. |
发明人 |
SNOEREN, RUDOLPH MARIA;VAN BUSSEL, ANTONIUS JOHANNUS FRANCISCUS |
分类号 |
H05G1/60;H04N5/225;H04N5/32;(IPC1-7):H04N5/32 |
主分类号 |
H05G1/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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