发明名称 Method of manufacturing a semiconductor integrated circuit device having at least one bipolar transistor and a plurality of MOS transistors
摘要 A semiconductor device includes a bipolar transistor and an IIL element fabricated on a single wafer. The emitter region of the bipolar transistor is formed by diffusing the impurity of an impurity layer formed in contact with the base region therein. The impurity layer is formed of a polycide layer formed of a polysilicon layer doped with an impurity and a metal silicide layer laminated on the polysilicon layer, a laminated layer of a polysilicon layer and a refractory metal layer, or a metal silicide layer.
申请公布号 US5280188(A) 申请公布日期 1994.01.18
申请号 US19920989455 申请日期 1992.12.08
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 IWASAKI, HIROSHI
分类号 H01L21/225;H01L21/8226;H01L21/8248;H01L21/8249;H01L27/02;H01L29/06;H01L29/45;H01L29/732;(IPC1-7):H01L29/72;H01L23/48;H01L29/46 主分类号 H01L21/225
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