发明名称 Highly pure hydrogen peroxide prodn. for use in semiconductor technology - by removing inorganic impurities in distilled soln. with membrane of ion exchange resin particles in desensitising polymer matrix
摘要 Prodn. of highly pure H2O2 (I), suitable for use in semiconductor technology, involves purifying H2O2 contg. only small amts. of dissolved inorg. impurities with an ion exchange resin (II). The novelty is that H2O2 (III) purified by distn. is contacted with membranes (IV) contg. (II) particles, embedded in a matrix of a polymer (V) contg. no ion exchange functional gps.. (III), pref. distilled through a borosilicate glass column, contains less than 100, esp. 10-50 ppb residual metal ions. It is contacted with and pref. filtered through (IV) contg. cation exchange (II) and then (IV) contg. anion exchange (II). (IV) contains 70-95 (wt.)% (II) particles, pref. of styrene-DVB copolymer. (III) is PTFE. USE/ADVANTAGE - (I) has the high purity required for the prodn. of 16 MB chips. The use of (IV), in which (II) is desensitised with (V), avoids the danger of decomposition of H2O2 to OH radicals and decomposition reactions between H2O2 and (II).
申请公布号 DE4222109(A1) 申请公布日期 1994.01.13
申请号 DE19924222109 申请日期 1992.07.06
申请人 SOLVAY INTEROX GMBH, 82049 HOELLRIEGELSKREUTH, DE 发明人 HONIG, HELMUT, 8191 GELTING, DE;GEIGEL, SIEGFRIED, 8190 WOLFRATSHAUSEN, DE
分类号 B01J47/12;C01B15/013;(IPC1-7):C01B15/013;B01J39/04;B01J41/04 主分类号 B01J47/12
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