发明名称 Apparatus for removing contamination from low density particulate materials
摘要 An apparatus is provided for the removal of oversized contaminants from particulate material the is particularly suitable for the removal of contaminants from low density, high surface area particulate materials. The removal of contaminants is accomplished during the transfer of the particulate material from its storage or transport container to a receiving container. The apparatus comprises an assembly having a weir, a trap disposed adjacent said weir, a screen o for separating particulate material from oversized contaminants, a baffle, and an opening through which particulate material will flow freely. The weir has a weir trap flange extending laterally from a weir wall. The trap is configured to capture contaminants if the container to which the assembly is secured is maneuvered to initiate the flow of the particulate material from the container to the receiving container. When so maneuvered, the lowermost portion of the trap in the proximity of the flow of the particulate materials subtends the weir. The screen permits particulate material trapped within the trap to pass therethrough so that the container can be completely emptied of particulate material while separating and capturing oversized contaminants. The baffle is spaced from the weir and disposed to deflect the flow of the particulate material towards the trap. The flow of particulate material follows a tortured path around the baffle and over the weir to exit the container through the opening.
申请公布号 US5277318(A) 申请公布日期 1994.01.11
申请号 US19920841940 申请日期 1992.02.26
申请人 THIOKOL CORPORATION 发明人 SMALLEY, JR., ROBERT B.;PARRY, BERT H.
分类号 B07B1/00;B07B1/06;(IPC1-7):B07B1/00 主分类号 B07B1/00
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