发明名称 Apparatus for measuring cross-sectional distribution of refractive index of optical waveguide by RNF method
摘要 According to the present invention, there are provided a projection system having an optical axis inclined toward one end surface of an optical waveguide portion arranged on one side of a substrate portion and for irradiating luminous flux for measurement from one end surface of the optical waveguide portion, and a light receiving unit for receiving luminous flux leaking from the optical waveguide portion among the luminous fluxes for measurement, projected light is effectively utilized for measurement, whereby cross-sectional distribution of refractive index of the optical waveguide is measured by change of light quantity entering said light receiving unit in case an incident point of the luminous flux is moved.
申请公布号 US5278628(A) 申请公布日期 1994.01.11
申请号 US19920864555 申请日期 1992.04.07
申请人 KABUSHIKI KAISHA TOPCON 发明人 GISIN, NICOLAS;STAMP, PATRICK;HORI, NOBUO
分类号 G01M11/02;G01N21/41;(IPC1-7):G01N21/41;G01N21/43 主分类号 G01M11/02
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