发明名称 |
Semiconductor integrated circuit having self-check and self-repair capabilities |
摘要 |
A semiconductor integrated circuit which has the function of self-checking defective bits, and which informs the exterior of its status when it has reached the status incapable of self-repair due to the limitation of the storage capacity of hardware for repairing the defective bits.
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申请公布号 |
US5278839(A) |
申请公布日期 |
1994.01.11 |
申请号 |
US19910693911 |
申请日期 |
1991.04.16 |
申请人 |
HITACHI, LTD. |
发明人 |
MATSUMOTO, MIKI;KAWAMOTO, HIROSHI |
分类号 |
G11C29/00;(IPC1-7):G01R31/28 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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