发明名称 Semiconductor integrated circuit having self-check and self-repair capabilities
摘要 A semiconductor integrated circuit which has the function of self-checking defective bits, and which informs the exterior of its status when it has reached the status incapable of self-repair due to the limitation of the storage capacity of hardware for repairing the defective bits.
申请公布号 US5278839(A) 申请公布日期 1994.01.11
申请号 US19910693911 申请日期 1991.04.16
申请人 HITACHI, LTD. 发明人 MATSUMOTO, MIKI;KAWAMOTO, HIROSHI
分类号 G11C29/00;(IPC1-7):G01R31/28 主分类号 G11C29/00
代理机构 代理人
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