发明名称 Semiconductor device with low ON resistance - has groove in layer surface, and second conductivity layer(s) with exposed surface
摘要 The device includes a groove (9) formed in the top surface of a first semiconductor layer (1) of a first conductivity type. At least one second semiconductor layer (2) of a second conductivity type has its surface exposed selectively on the top surface of the first semiconductor layer such that between them is a defined boundary line, orthogonal to the longitudinal direction of the groove. At least on the top of the groove surface a control insulating layer (4) is formed, on which a control electrode (5) is deposited. Pref. the second semiconductor layer is selectively formed in the top surface of the first semiconductor layer, e.g. in the form of a strip. Alternately several grooves in mutually parallel configuration may be formed. USE/ADVANTAGE - For Vertical Double Diffusion MOS components, with low ON resistance, without influencing holding voltage in OFF state.
申请公布号 DE4319071(A1) 申请公布日期 1994.01.05
申请号 DE19934319071 申请日期 1993.06.08
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP 发明人 TERASHIMA, TOMOHIDE, FUKUOKA, JP
分类号 H01L21/331;H01L21/332;H01L21/336;H01L29/06;H01L29/423;H01L29/739;H01L29/745;H01L29/749;H01L29/78;(IPC1-7):H01L29/784 主分类号 H01L21/331
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