| 摘要 |
The invention set forth methods and apparatus for correcting the effect on image quality of a film processor having the steps of shielding a first portion along one edge of a film from x-ray energy and impressing, on the first portion, a first calibrated test pattern having a first calibrated graded stepwise density pattern made from visible light. A first plurality of symbols located adjacent the first pattern to indicate the magnitude of one of the density positions. Impressed along one edge of a control film, a second calibrated test pattern, which includes a second calibrated graded stepwise density pattern made from visible light. A second plurality of symbols are provided adjacent the second pattern to indicate the magnitude of one of the density positions. The performance of the film processor used to develop both films is measured and affected by comparing and noting the symbols associated with those density positions between the first and second test patterns.
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