发明名称 Method for preparing resist patterns utilizing solvent development with subsequent resist pattern transfer, via a photo-hardening liquid adhesive, to a receiver substrate and oxygen reactive ion etching
摘要 A method of preparing a fine pattern on a substrate characterized by the dry development of a photoimaged, etch resistant pattern on a receiver substrate. The pattern is transferred from a carrier substrate to the receiver substrate via a hardenable liquid adhesive. This method eliminates adverse reflection effects caused from substrate topography in single layer photoresist systems and also avoids time consuming multiple coatings in multilayer photoresist systems used to make fine patterns. The method is particularly useful in the fabrication of integrated circuits and fine dimension patterns.
申请公布号 US5275913(A) 申请公布日期 1994.01.04
申请号 US19930056617 申请日期 1993.05.04
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 LIN, DHEI-JHAI
分类号 G03F7/40;(IPC1-7):G03F7/30;G03F7/36 主分类号 G03F7/40
代理机构 代理人
主权项
地址