发明名称 Selected novolak resin planarization layer for lithographic applications
摘要 A method of planarizing topographical features on a substrate for subsequent coating of a radiation sensitive composition thereon comprising: (1) applying thereover a coating of a planarizing coating layer comprising a planarization layer of novolak resin made by the condensation reaction of an aldehyde source with a phenolic monomeric source comprising at least 25 mole percent of ortho-secondary butyl phenol and a suitable solvent; and (2) heating said coated substrate to remove essentially all of said solvent therefrom and cause said coating to reflow, thereby planarizing the topographical features.
申请公布号 US5276126(A) 申请公布日期 1994.01.04
申请号 US19930015055 申请日期 1993.02.08
申请人 OCG MICROELECTRONIC MATERIALS, INC. 发明人 ROGLER, ROBERT F.
分类号 C08G8/24;C08L61/10;G03F7/09;(IPC1-7):C08G8/24;G03C1/52;B05D5/12;B29D22/00 主分类号 C08G8/24
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