发明名称 |
Selected novolak resin planarization layer for lithographic applications |
摘要 |
A method of planarizing topographical features on a substrate for subsequent coating of a radiation sensitive composition thereon comprising: (1) applying thereover a coating of a planarizing coating layer comprising a planarization layer of novolak resin made by the condensation reaction of an aldehyde source with a phenolic monomeric source comprising at least 25 mole percent of ortho-secondary butyl phenol and a suitable solvent; and (2) heating said coated substrate to remove essentially all of said solvent therefrom and cause said coating to reflow, thereby planarizing the topographical features.
|
申请公布号 |
US5276126(A) |
申请公布日期 |
1994.01.04 |
申请号 |
US19930015055 |
申请日期 |
1993.02.08 |
申请人 |
OCG MICROELECTRONIC MATERIALS, INC. |
发明人 |
ROGLER, ROBERT F. |
分类号 |
C08G8/24;C08L61/10;G03F7/09;(IPC1-7):C08G8/24;G03C1/52;B05D5/12;B29D22/00 |
主分类号 |
C08G8/24 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|