发明名称 FINE DISPLACEMENT ELEMENT AND SCANNING TUNNELING MICROSCOPE USING SAID ELEMENT AND INFORMATION PROCESSOR
摘要 PURPOSE:To manufacture an information processor proper to the operation at high speed of a fine displacement element by mounting a probe detecting tunnel currents to a cantilever composed of an elastic body thin-film and one piezoelectric thin-film held by a pair of electrodes on one surface of a silicon substrate. CONSTITUTION:An Si3N4 film is formed onto an Si substrate 1 as an elastic body thin-film 2. The Young's modulus of the film is 2X10<11>N/m<2>. The elastic body thin-film 2 is patterned in a desired shape, and Cr and Au are flit-formed and patterned. ZnO is film-formed as a piezoelectric body thin-film 4. ZnO is used as a target and sputtered in an O2 atmosphere, and patterned. An upper electrode 5 is shaped through the same manufacture as a lower electrode 3. W is film-formed as an electrode material for a probe, the probe 6 is manufactured through photolithography and lift-off, and the desired section of the Si substrate 1 is removed through the anisotropic etching of Si by KOH, thus manufacturing a fine displacement element.
申请公布号 JPH05347439(A) 申请公布日期 1993.12.27
申请号 JP19920151255 申请日期 1992.05.20
申请人 CANON INC 发明人 YAMAMOTO KEISUKE;KASANUKI YUJI;SUZUKI YOSHIO;YAGI TAKAYUKI;NAKAYAMA MASARU;HIRAI YUTAKA
分类号 B81B3/00;G01N27/00;G01N37/00;G01Q20/04;G01Q30/02;G01Q60/10;G01Q60/16;G01Q70/06;G01Q70/14;G01Q80/00;G11B9/00;G11B9/14;H01L41/09;H01L41/18;H02N2/00 主分类号 B81B3/00
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