MEASURING METHOD FOR LUMINANCE OF SEMICONDUCTOR PELLET

摘要

PURPOSE:To improve a luminance measuring accuracy due to an irregularity in a mounting position accuracy of a semiconductor element to be measured on a measuring base and a variation in a shade of a probe needle in contact with an electrode of the element to be measured and to alleviate a damage of the element at the time of measuring. CONSTITUTION:A method for measuring luminance of a semiconductor element 2 to be measured employs a method for bringing an etching mesh 7 into contact with electrodes of the element 2 to be measured to largely improve luminance measuring accuracy from + or -10% of prior art to + or -5% or less.