| 摘要 |
PURPOSE:To offer a method of preparing test patterns which is capable of reproducing operations of a parts mounting machine only through fine adjustment, wherein the test pattern prepared by a test pattern preparing device is approached to the operation of the mounting machine. CONSTITUTION:Each terminal of an IC 2 mounted on a parts mounting machine 1 undergoes probing. Signal at a clock terminal 5 is taken in a counter 6, which counts pulses at the clock terminal 5, the result being emitted on the real time basis. A logic analyzer 3 takes in the output of the counter 6 and the logical level of IC terminal through sampling process. On the basis of the data sampled, a conversion device 4 calculates the number of patterns from the output data of the counter 6, combines with the data of the logical level at the IC terminal, and produces a test pattern. Because of possibility of preparing test pattern near the operation of the mounting machine, a test pattern which can reproduce the operation of the mounting machine can be achieved easily. |
