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发明名称
TESTING METHOD FOR HYBRID IC
摘要
申请公布号
JPH05343491(A)
申请公布日期
1993.12.24
申请号
JP19920149336
申请日期
1992.06.09
申请人
MITSUBISHI ELECTRIC CORP
发明人
HIDAKA SHINJI;MIYOSHI MOTOHIDE
分类号
G01R31/28;H01L21/66;(IPC1-7):H01L21/66
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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