发明名称 |
Semiconductor memory cell capacitor prodn. - involves forming multilayer cylindrical storage electrode |
摘要 |
(A) A semiconductor memory cell capacitor has a cylindrical storage electrode with three or more layers. (B) Prodn. of a semiconductor memory cell capacitor involves (a) producing first, second and third interlayers successively on a conductive substrate and then producing a capacitor contact hole; (b) depositing a first conductive layer on the entire surface ad a fourth interlayer (25) on the first conductive layer; (c) depositing and structuring a second conductive layer (26) to produce a protruding section (27); (d) forming a multilayer stack for alternate third conductive layers (28) and fifth interlayers (29) on the protruding section (27); (e) back-etching the third conductive layers and fifth interlayers to leave multilayer ribs (33) around the second conductive layer (26); (f) etching the fourth interlayer (25) using the ribs (33) as mask; (G0 depositing a fourth conductibe layer; (h) back-etching the fourth, third, second and first conductive layers; (i) etching the fourth and third interlayers by wet etching to form a first storage electrode; and (j) producing a dielectric layer on the first storage electrode and a capacitor electrode plate on the dielectric layer. ADVANTAGE - The capacitor has increased capacitance.
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申请公布号 |
DE4320060(A1) |
申请公布日期 |
1993.12.23 |
申请号 |
DE19934320060 |
申请日期 |
1993.06.17 |
申请人 |
GOLD STAR ELECTRON CO., LTD., CHUNGCHEONGBUK, KR |
发明人 |
JUN, YOUNG-KWON, SEOUL/SOUL, KR |
分类号 |
H01L21/302;H01L21/02;H01L21/3065;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108;(IPC1-7):H01L21/28;H01L23/50;H01L21/90;H01L29/92;H01L27/105 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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