发明名称 SELF ALIGNMENT CONTACT FORMING METHOD
摘要 The method for forming a self-aligned contact is characterized by (a) laminating an insulating layer with a first nitride film (b), a second oxide film (2") and a second nitride film (6'), (b) forming a photoresist film pattern (4) on the film (6'), (c) removing the films (2",6') by the dry etching, (d) removing the pattern (4) and the films (2",6,6') by the wet etching to form a contact hole (20), (e) forming an electroconductive layer (8), and (f) contacting the layer (8) to the contact region through the contact hole (20).
申请公布号 KR930011502(B1) 申请公布日期 1993.12.08
申请号 KR19900019047 申请日期 1990.11.23
申请人 HYUNDAI ELECTRONICS CO., LTD. 发明人 KIM, IL - UK;KANG, MI - YONG;PARK, HUI - KUK
分类号 (IPC1-7):H01L21/90 主分类号 (IPC1-7):H01L21/90
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