Semiconductor integrated circuit capable of compensating errors in manufacturing process

摘要

The gate of a first P-channel transistor of a first comparator is supplied with an input signal, and the gate of a second P-channel transistor of the first comparator is supplied with a reference voltage. An output terminal of the first comparator is connected to an output circuit and the gates of first and second P-channel transistors of a second comparator are supplied with the reference voltage. The second comparator outputs a voltage equal to a stand-by time output voltage of the first comparator and the output voltage from the second comparator is supplied to the non-inversion input terminal of a third comparator which is connected to a voltage generating circuit. The voltage generating circuit has substantially the same dimension ratio as the output circuit and generates a voltage equal to the threshold voltage of the output circuit. A third comparator controls the first P-channel transistors of the first and second comparators in accordance with a difference voltage between the output voltage of the second comparator and the output voltage of the voltage generating circuit to thereby automatically set a stand-by time output voltage of the first comparator at a value close to the threshold of the output circuit.