发明名称 |
POLYCRISTALLINE SILICON THIN FILM AND PROCESS FOR FORMING IT AT LOW TEMPERATURE. |
摘要 |
<p>A polycrystalline silicon thin film, which can be formed at a temperature below 400 DEG C on a cheap glass base plate (3) such as a blue plate glass, or on a glass base plate (3) provided with metallic electrodes or transparent electrodes, and whose hydrogen content is less than 5 atom %. The polycrystalline silicon thin film can be formed at such a temperature by repeating several times the steps of forming an amorphous silicon film on the glass plate by, e.g., a CVD technique and then exposing the film to a hydrogen plasma for a predetermined time. <IMAGE></p> |
申请公布号 |
EP0571632(A1) |
申请公布日期 |
1993.12.01 |
申请号 |
EP19920923561 |
申请日期 |
1992.11.16 |
申请人 |
KANEGAFUCHI CHEMICAL INDUSTRY CO., LTD. |
发明人 |
YAMAMOTO, KENJI 1-3-504, YOSHIDA-CHO 1-CHOME;OKAMOTO, KEISHI 6-31-17, SHIOYA |
分类号 |
H01L21/205;H01L21/30;(IPC1-7):H01L21/205 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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