发明名称 POLYCRISTALLINE SILICON THIN FILM AND PROCESS FOR FORMING IT AT LOW TEMPERATURE.
摘要 <p>A polycrystalline silicon thin film, which can be formed at a temperature below 400 DEG C on a cheap glass base plate (3) such as a blue plate glass, or on a glass base plate (3) provided with metallic electrodes or transparent electrodes, and whose hydrogen content is less than 5 atom %. The polycrystalline silicon thin film can be formed at such a temperature by repeating several times the steps of forming an amorphous silicon film on the glass plate by, e.g., a CVD technique and then exposing the film to a hydrogen plasma for a predetermined time. <IMAGE></p>
申请公布号 EP0571632(A1) 申请公布日期 1993.12.01
申请号 EP19920923561 申请日期 1992.11.16
申请人 KANEGAFUCHI CHEMICAL INDUSTRY CO., LTD. 发明人 YAMAMOTO, KENJI 1-3-504, YOSHIDA-CHO 1-CHOME;OKAMOTO, KEISHI 6-31-17, SHIOYA
分类号 H01L21/205;H01L21/30;(IPC1-7):H01L21/205 主分类号 H01L21/205
代理机构 代理人
主权项
地址