| 摘要 |
A semiconductor integrated circuit comprises a random access memory subjected to a functional test by a testing unit with a multi-bit testing data, and the multi-bit testing data is distributed to parts of a write-in data port of the random access memory device through a plurality sets of auxiliary write-in data line groups, because the write-in data port can accept a multi-bit write-in data larger in number than the multi-bit testing data, wherein a comparator is coupled to parts of the read-out data port for producing a reporting signal indicative of consistency or inconsistency so that the testing unit examines the random access memory device with the read-out bit at one of the parts of the read-out data port and the reporting signal.
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