发明名称 Semiconductor structure having a barrier layer disposed within openings of a dielectric layer
摘要 A method for connecting devices on an integrated circuit substrate to a metallization layer, wherein a thin layer of a dielectric material is deposited on the substrate, and openings are formed in the dielectric layer wherein electrical connection is to be made to the substrate. A metal barrier layer then is deposited selectively in the openings of the dielectric layer, the barrier layer completely covering the exposed portions of the substrate. A pillar metal layer then may be deposited as a blanket coating over the dielectric layer and over the portions of he barrier layer covering the exposed portions of the substrate. The pillar metal layer is etched for forming metal pillars extending from the exposed portions of the substrate. The substrate then is planarized by depositing a dielectric layer and etching it back for exposing the pillars for coupling to a later deposited metallization layer.
申请公布号 US5266835(A) 申请公布日期 1993.11.30
申请号 US19920969539 申请日期 1992.10.30
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 KULKARNI, VIVEK D.
分类号 H01L21/768;(IPC1-7):H01L29/68;H01L29/06;H01L29/34 主分类号 H01L21/768
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