发明名称 PROCESS APPARATUS
摘要 <p>A process apparatus whose chamber can be cleaned in a short time not exposed to air at all. At least two electrodes of first and second electrodes (107, 105) are provided in a vacuum vessel (108). A high-frequency power (112) having a first frequency is supplied to the first electrode (107), and a high-frequency power (101) having a second frequency different from the first frequency is supplied to the second electrode (105). A mechanism for supporting a wafer (106) is disposed on the second electrode (105), and a gas introduced into the vacuum vessel (108) is turned into a plasma by the powers. In this apparatus, a mechanism, by which the impedance between the second electrode (107) and a ground can be made enough larger than that between the first electrode and the ground, if necessary, is provided.</p>
申请公布号 WO1993023978(P1) 申请公布日期 1993.11.25
申请号 JP1993000622 申请日期 1993.05.12
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